In-Circuit Test (ICT) System Medalist i3070x Series 6


Description
Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.
Key Features & Specifications
• Max node count : 5184
• Max channel count : 1152
• Footprint : 2.4 m x 0.8 m / 7.8’ x 2.6’
• Max no of modules : 4
Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.
- Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails and dynamic flash programming.
- 100% backwards compatibility guarantees minimal down time for installation and complete code compatibility.
- Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
- Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
- Industry leading support with Keysight On-site Now! glasses. Get quick, secure, hands-free help from the experts in record time.
- Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.
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